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Member of the Texas Instruments

Widebus Family

Compatible With IEEE Std 1149.1-1990

(JTAG) Test Access Port and

Boundary-Scan Architecture

Includes D-Type Flip-Flops and Control

Circuitry to Provide Multiplexed

Transmission of Stored and Real-Time Data

Two Boundary-Scan Cells Per I/O for

Greater Flexibility

SCOPE? Instruction Set

– IEEE Std 1149.1-1990 Required

Instructions, Optional INTEST, and

P1149.1A CLAMP and HIGHZ

– Parallel Signature Analysis at Inputs

With Masking Option

– Pseudorandom Pattern Generation From

Outputs

– Sample Inputs/Toggle Outputs

– Binary Count From Outputs

– Device Identification

– Even-Parity Opcodes

description (continued)

In the normal mode, this device is an 18-bit bus transceiver and register that allows for multiplexed transmission

of data directly from the input bus or from the internal registers. It can be used either as two 9-bit transceivers

or one 18-bit transceiver. The test circuitry can be activated by the TAP to take snapshot samples of the data

appearing at the device pins or to perform a self-test on the boundary test cells. Activating the TAP in the normal

mode does not affect the functional operation of the SCOPE bus transceivers and registers.

Transceiver function is controlled by output-enable (OE) and direction (DIR) inputs. When OE is low, the

transceiver is active and operates in the A-to-B direction when DIR is high or in the B-to-A direction when DIR

is low. When OE is high, both the A and B outputs are in the high-impedance state, effectively isolating both

buses.

Data flow is controlled by clock (CLKAB and CLKBA) and select (SAB and SBA) inputs. Data on the A bus is

clocked into the associated registers on the low-to-high transition of CLKAB. When SAB is low, real-time A data

is selected for presentation to the B bus (transparent mode). When SAB is high, stored A data is selected for

presentation to the B bus (registered mode). The function of the CLKBA and SBA inputs mirrors that of CLKAB

and SAB, respectively. Figure 1 illustrates the four fundamental bus-management functions that can be

performed with the SN74ABT18646.

In the test mode, the normal operation of the SCOPE bus transceivers and registers is inhibited, and the test

circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry can

perform boundary scan test operations according to the protocol described in IEEE Std 1149.1-1990.

Four dedicated test pins are used to observe and control the operation of the test circuitry: test data input (TDI),

test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry can perform

other testing functions, such as parallel signature analysis on data inputs and pseudorandom pattern generation

from data outputs. All testing and scan operations are synchronized to the TAP interface.

Additional flexibility is provided in the test mode through the use of two boundary scan cells (BSCs) for each

I/O pin. This allows independent test data to be captured and forced at either bus (A or B). A PSA/COUNT

instruction is also included to ease the testing of memories and other circuits where a binary count addressing

scheme is useful.