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Members of the Texas Instruments

SCOPE E Family of Testability Products

Members of the Texas Instruments

WidebusE Family

Compatible With the IEEE Standard

1149.1-1990 (JTAG) Test Access Port and

Boundary-Scan Architecture

SCOPE E Instruction Set

– IEEE Standard 1149.1-1990 Required

Instructions and Optional CLAMP and

HIGHZ

– Parallel-Signature Analysis at Inputs

– Pseudo-Random Pattern Generation

From Outputs

– Sample Inputs/Toggle Outputs

– Binary Count From Outputs

– Device Identification

– Even-Parity Opcodes

State-of-the-Art EPIC-IIBE BiCMOS Design

Significantly Reduces Power Dissipation

Packaged in Plastic Shrink Small-Outline

(DL) and Thin Shrink Small-Outline (DGG)

Packages and 380-mil Fine-Pitch Ceramic

Flat (WD) Packages

description

The ’ABT18640 scan test devices with 18-bit

inverting bus transceivers are members of the

Texas Instruments SCOPEE testability

integrated-circuit family. This family of devices

supports IEEE Standard 1149.1-1990 boundary

scan to facilitate testing of complex circuit-board

assemblies. Scan access to the test circuitry is

accomplished via the 4-wire test access port

(TAP) interface.

In the normal mode, these devices are 18-bit inverting bus transceivers. They can be used either as two 9-bit

transceivers or one 18-bit transceiver. The test circuitry can be activated by the TAP to take snapshot samples

of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP

in the normal mode does not affect the functional operation of the SCOPEE bus transceivers.

Data flow is controlled by the direction-control (DIR) and output-enable (OE) inputs. Data transmission is

allowed from the A bus to the B bus or from the B bus to the A bus, depending on the logic level at DIR. OE can

be used to disable the device so that the buses are effectively isolated.

In the test mode, the normal operation of the SCOPEE bus transceivers is inhibited and the test circuitry is

enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry can perform

boundary-scan test operations according to the protocol described in IEEE Standard 1149.1-1990.