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位置:SCAN92LV090SLCSLASHNO.A > SCAN92LV090SLCSLASHNO.A詳情

SCAN92LV090SLCSLASHNO.A中文資料

廠家型號

SCAN92LV090SLCSLASHNO.A

文件大小

853.04Kbytes

頁面數(shù)量

22

功能描述

SCAN92LV090 9 Channel Bus LVDS Transceiver w/ Boundary SCAN

數(shù)據(jù)手冊

下載地址一下載地址二到原廠下載

生產(chǎn)廠商

TI2

SCAN92LV090SLCSLASHNO.A數(shù)據(jù)手冊規(guī)格書PDF詳情

1FEATURES

2? IEEE 1149.1 (JTAG) Compliant

? Bus LVDS Signaling

? Low Power CMOS Design

? High Signaling Rate Capability (Above 100

Mbps)

? 0.1V to 2.3V Common Mode Range for VID =

200mV

? ±100 mV Receiver Sensitivity

? Supports Open and Terminated Failsafe on

Port Pins

? 3.3V Operation

? Glitch Free Power Up/Down (Driver & Receiver

Disabled)

? Light Bus Loading (5 pF Typical) per Bus

LVDS Load

? Designed for Double Termination Applications

? Balanced Output Impedance

? Product Offered in 64 Pin LQFP Package and

NFBGA Package

? High Impedance Bus Pins on Power Off (VCC =

0V)

DESCRIPTION

The SCAN92LV090A is one in a series of Bus LVDS

transceivers designed specifically for the high speed,

low power proprietary backplane or cable interfaces.

The device operates from a single 3.3V power supply

and includes nine differential line drivers and nine

receivers. To minimize bus loading, the driver outputs

and receiver inputs are internally connected. The

separate I/O of the logic side allows for loop back

support. The device also features a flow through pin

out which allows easy PCB routing for short stubs

between its pins and the connector.

The driver translates 3V TTL levels (single-ended) to

differential Bus LVDS (BLVDS) output levels. This

allows for high speed operation, while consuming

minimal power with reduced EMI. In addition, the

differential signaling provides common mode noise

rejection of ±1V.

The receiver threshold is less than ±100 mV over a

±1V common mode range and translates the

differential Bus LVDS to standard (TTL/CMOS)

levels.

This device is compliant with IEEE 1149.1 Standard

Test Access Port and Boundary Scan Architecture

with the incorporation of the defined boundary-scan

test logic and test access port consisting of Test Data

Input (TDI), Test Data Out (TDO), Test Mode Select

(TMS), Test Clock (TCK), and the optional Test Reset

(TRST).

更新時間:2025-9-23 11:00:00
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